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Every article on Frontiers is peer reviewed, permanently archived and free to read.

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Original Research
Published 12 March 2026
CBAM-enhanced lightweight CNN for wafer map defect classification
Mst. Rokeya Khatun · Fahmid Al Farid · Sharith Dhar · Md. Saiful Islam · Jia Uddin · Hezerul bin Abdul Karim
Frontiers in Electronics
doi 10.3389/felec.2026.1750707